Reliability

LightCube has a state of the art know-how in reliability analysis of optoelectronic components, devices and systems:



  • More than 100 optoelectronic scientific publication on international journals

  • Constant participation at relevant conferences and symposiums

  • More than 100,000 device-h of accelerated stress analysis per year


Temperature studyReliability at different operating conditions, understanding what is the safe operating area in terms of driving, temperature, humidy, ...
 MappingFailure analisis, understanding why a device is failing and how to modify its structure/design in order to overcome reliability issues.
 Lifetime estimation

Degradation models, with a degradation model it is possible to understand how a device is going to degrade to a specified operating condition.


 


Lifetime estimation, fundamental information for market products and industrial devices.


 Degradation compensationDegradation compensation, studying driving and management solutions to reduce the effects of ageing if still presents.

LightCube 2011  All rights reserverd

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